Spectroscopic ellipsometry of SiO2/CdTe
Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering
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S.K. Bera; D. Bhattacharyya; R. Ghosh; G.K. Paul
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Article
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2009
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Elsevier Science
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English
โ 455 KB