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A Spectroscopic Ellipsometry Study of TiO 2 Thin Films Prepared by dc Reactive Magnetron Sputtering: Annealing Temperature Effect

โœ Scribed by Horprathum, Mati; Chindaudom, Pongpan; Limsuwan, Pichet


Book ID
120449763
Publisher
Institute of Physics
Year
2007
Tongue
English
Weight
438 KB
Volume
24
Category
Article
ISSN
0256-307X

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