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A soft threshold lucky electron model for efficient and accurate numerical device simulation

✍ Scribed by Chr. Jungemann; R. Thoma; W.L. Engl

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 817 KB
Volume: 39
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(95)00403-3

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