✦ LIBER ✦
A lucky drift model, including a soft threshold energy, for the relation between gate and substrate currents in MOSFETs
✍ Scribed by Sumio Tanaka
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 813 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0038-1101
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