Development and experimental verification of a two-dimensional numerical model of piezoelectrically induced threshold voltage shifts in GaAs MESFETs : J -C RAMIREZ, P J McNALLY, L S COOPER, J J ROSENBERG, L B FREUND (Div. of Eng., Brown Univ., Providence, RI, USA), T N JACKSON IEEE Trans. Electron. Devices (USA), vol. 35, no. 8, pp. 1232–1240 (Aug. 1988)

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 104 KB
• Volume: 20
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/0026-2692(89)90092-x