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A Soft Error Rate Model for MOS Dynamic RAM's

โœ Scribed by Toyabe, T.; Shinoda, T.; Aoki, M.; Kawamoto, H.; Mitsusada, K.; Masuhara, T.; Asai, S.


Book ID
119798126
Publisher
IEEE
Year
1982
Tongue
English
Weight
937 KB
Volume
17
Category
Article
ISSN
0018-9200

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A soft error rate model for MOS dynamic
โœ Toyabe, T.; Shinoda, T.; Aoki, M.; Kawamoto, H.; Mitsusada, K.; Masuhara, T.; As ๐Ÿ“‚ Article ๐Ÿ“… 1982 ๐Ÿ› IEEE ๐ŸŒ English โš– 559 KB