A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits

✍ Scribed by Layman, P.A.; Chamberlain, S.G.

• Book ID: 119773659
• Publisher: IEEE
• Year: 1989
• Tongue: English
• Weight: 1023 KB
• Volume: 24
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/4.16305