Comments on `A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits'

✍ Scribed by Kolodziejski, J.F.; Spiralski, L.

• Book ID: 119774745
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 117 KB
• Volume: 25
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/4.58304