A simple technique to measure generation lifetime in partially depleted SOI MOSFETs

✍ Scribed by Hyungcheol Shin; Racanelli, M.; Huang, W.M.; Foerstner, J.; Seokjin Choi; Schroder, D.K.

• Book ID: 114537486
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 99 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.726663