A new linear sweep technique to measure generation lifetimes in thin-film SOI MOSFET's

✍ Scribed by Venkatesan, S.; Pierret, R.F.; Neudeck, G.W.

• Book ID: 114535671
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 809 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.278511