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A secondary ion mass spectrometry study of two-layer systems based on tellurium

โœ Scribed by V. Labunov; B. Kolosnicin; D. Marton; Z. Miminoshvili

Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
412 KB
Volume
112
Category
Article
ISSN
0040-6090

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Dissociation study of tellurium cluster
Dissociation study of tellurium cluster ions, Ten+ (n = 25-85) using secondary ion mass spectrometry
โœ Ito, Hiroyuki; Matsuo, Takekiyo; Sato, Takaya; Ichiharai, Toshio; Katakuse, Itsu ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 99 KB ๐Ÿ‘ 2 views

Dissociation pathways of tellurium clusters, Te n Y (n = 25-85), were investigated by secondary ion mass spectrometry. Positively charged ions were generated from a tellurium sheet by bombardment with 10 keV xenon ion beam. Mass analyses of cluster ions were performed using a grand-scale sector mass