𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Secondary ion mass spectrometry in the characterisation of boron-based ceramics

✍ Scribed by S. Daolio; M. Fabrizio; C. Piccirillo; M. L. Muolo; A. Passerone; A. Bellosi


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
279 KB
Volume
15
Category
Article
ISSN
0951-4198

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Quantitative secondary ion mass spectrom
✍ Yamazaki, Hideyuki; Takahashi, Mamoru πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 262 KB πŸ‘ 2 views

Quantitative analysis of the native oxide on silicon wafers has been investigated by secondary ion mass spectrometry (SIMS) combined with an encapsulation method. In the encapsulation technique, the sample surface is covered with a thin Ðlm whose material is identical to that of the substrate of the

Secondary ion mass spectrometry round-ro
✍ Homma, Y.; Tohjou, F.; Masamoto, A.; Shibata, M.; Shichi, H.; Yoshioka, Y.; Adac πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 330 KB πŸ‘ 2 views

Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were