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A Scan-BIST Structure to Test Delay Faults in Sequential Circuits

✍ Scribed by P. Girard; C. Landrault; V. Moreda; S. Pravossoudovitch; A. Virazel

Book ID: 110261620
Publisher: Springer US
Year: 1999
Tongue: English
Weight: 114 KB
Volume: 14
Category: Article
ISSN: 0923-8174
DOI: 10.1023/a:1008305507376

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