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A Rutherford backscattering study of the stoichiometry of thin thallium iodine films

✍ Scribed by S.C. Ling; R. Berliner; S.L. Blatt; O.F. Swenson

Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 250 KB
Volume: 67
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(80)90290-4

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## Abstract Formation of Ag~2~Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag~2~Te. Struc