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Transmission electron microscopy and Rutherford backscattering spectrometry studies of Ag2Te films formed from Ag-Te thin film couples

✍ Scribed by B. C. Mohanty; S. Kasiviswanathan


Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
529 KB
Volume
41
Category
Article
ISSN
0232-1300

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✦ Synopsis


Abstract

Formation of Ag~2~Te thin films from room temperature (300 K) solid state reaction of Ag and Te thin film couples is investigated. Rutherford Backscattering Spectrometry (RBS) studies confirmed the complete miscibility of the couples and the stoichiometry of the resulting Ag~2~Te. Structural analysis by Transmission Electron Microscopy (TEM) showed a fine‐grained structure with monoclinic and orthorhombic phases. Annealing at high temperatures resulted in the growth of giant crystallites with monoclinic phase at random sites. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)