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A Rietveld refinement using neutron powder diffraction data of a fully deuterated topaz, Al2SiO4(OD)2

โœ Scribed by Chen, Jianrong ;Lager, George A. ;Kunz, Martin ;Hansen, Thomas C. ;Ulmer, Peter

Publisher
International Union of Crystallography
Year
2005
Tongue
English
Weight
198 KB
Volume
61
Category
Article
ISSN
1600-5368

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โœฆ Synopsis

A polycrystalline sample (25 mg) of topaz-OD was prepared from SiO 2 , -Al 2 O 3 and D 2 O at 1023 K, 7.5 GPa, for 21 h using a rocking multi-anvil press.

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โœ Bryan C. Chakoumakos; Jaime A. Fernandez-Baca; Lynn A. Boatner ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 314 KB

The \(M \mathrm{CuSi}_{4} \mathrm{O}_{10}(M=\mathrm{Ca}, \mathrm{Sr}, \mathrm{Ba})\) compounds possess the gillespite \(\left(\mathrm{BaFeSi}_{4} \mathrm{O}_{10}\right)\) structure, which is tetragonal, \(P 4 / n c c, Z=4\). Data sets of 2365 step intensities were recorded for the title compounds wi