๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A review of surface contamination and the stability of standard masses

โœ Scribed by Davidson, Stuart


Book ID
121470683
Publisher
Institute of Physics
Year
2003
Tongue
English
Weight
327 KB
Volume
40
Category
Article
ISSN
0026-1394

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Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the