๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Studies of the surface of mass standards

โœ Scribed by M. Plassa; A. Calcatelli; M. Bergoglio


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
132 KB
Volume
16
Category
Article
ISSN
0142-2421

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Time-of-flight static secondary ion mass
โœ Bibhash R. Chakraborty; Daniel E. Lehman; Nicholas Winograd ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 193 KB ๐Ÿ‘ 2 views

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to characterize surface contaminants on a Pt-10% Ir alloy sample prescribed for fabrication of a prototype kilogram mass standard. The identification of various oxygenated and non-oxygenated hydrocarbon adsorbates on the