A review of RAM testing methodologies
β Scribed by A. Corsi; C Morandi
- Book ID
- 104157094
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 800 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2692
No coin nor oath required. For personal study only.
β¦ Synopsis
Thefoundationsof RAM testing theoryarereviewed andseveraltest procedures designed to cover logical faults are examined in the light of experience of problems most frequently encountered.Widely used test patterns,derived on the basis of simple considerations,are analysed within the framework of the above theory. The resultsof this analysis,summarisedin atable, provide a useful guidefor the choice of the test patternsto be usedfor characterisationor volume testing of RAM chips.
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