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A review of RAM testing methodologies

✍ Scribed by A. Corsi; C Morandi


Book ID
104157094
Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
800 KB
Volume
14
Category
Article
ISSN
0026-2692

No coin nor oath required. For personal study only.

✦ Synopsis


Thefoundationsof RAM testing theoryarereviewed andseveraltest procedures designed to cover logical faults are examined in the light of experience of problems most frequently encountered.Widely used test patterns,derived on the basis of simple considerations,are analysed within the framework of the above theory. The resultsof this analysis,summarisedin atable, provide a useful guidefor the choice of the test patternsto be usedfor characterisationor volume testing of RAM chips.


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