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A review of RAM testing methodologies : A. Corsi and C. Morandi. Microelectron. J.14 (2), 55 (1983)

Book ID: 103279717
Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 123 KB
Volume: 24
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(84)90781-9

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A review of RAM testing methodologies

✍ A. Corsi; C Morandi 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 800 KB

Thefoundationsof RAM testing theoryarereviewed andseveraltest procedures designed to cover logical faults are examined in the light of experience of problems most frequently encountered.Widely used test patterns,derived on the basis of simple considerations,are analysed within the framework of the a