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A quasi-static technique for MOS C-V and surface state measurements

✍ Scribed by M. Kuhn

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 871 KB
Volume: 13
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(70)90073-0

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