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A probe with ultrathin film deflection sensor for scanning probe microscopy and material characterization

✍ Scribed by Angelo Gaitas; Tao Li; Weibin Zhu

Book ID: 108263092
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 364 KB
Volume: 168
Category: Article
ISSN: 0924-4247
DOI: 10.1016/j.sna.2011.04.023

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