A Novel Method for Time-resolved Characterization of Micromagnetic Stray Fields with Scanning Probe Microscopy
✍ Scribed by Bangert, J.; Kasim, S.; Mertin, W.; Kubalek, E.
- Publisher
- John Wiley and Sons
- Year
- 1997
- Tongue
- English
- Weight
- 420 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
Scanning probe microscopy is opening new applications in magnetic engineering due to superior resolution limits without any sample preparation under ambient conditions. In this paper we report time-resolved magnetic stray Ðeld measurements based on a new type of probe to characterize magnetic Ðelds. The probe used was a magnetoresistive probe head fastened to a scanning probe microscope. The characteristics of the novel method are checked out on di †erent test structures. In our experimental set-up we have shown the ability of the novel method to characterize time-dependent magnetic stray Ðelds with micrometre spatial resolution and microtesla magnetic Ðeld resolution with kilohertz bandwidth. The experimental results reported are waveform measurements on distinct testpoints (zero-dimensional), linescans (one-dimensional) and two-dimensional stray Ðeld distributions. Applications in three-dimensional measurements are discussed.