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A preliminary study of impurities and defects in Si-MBE layers

✍ Scribed by R.F. Houghton; G. Patel; W.Y. Leong; T.E. Whall; E.H.C. Parker; R.A.A. Kubiak; R. Nayler

Publisher
Elsevier Science
Year
1987
Tongue
English
Weight
484 KB
Volume
81
Category
Article
ISSN
0022-0248

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