Surface segregation of boron atoms in Si and strained Si1−xGex layers during MBE growth: experiment and simulation

✍ Scribed by D. Krüger; H.J. Osten

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 708 KB
• Volume: 258
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(94)06385-0