A novel technique for the preparation of
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Heuer, J. P. ;Howitt, D. G.
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Article
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1990
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Wiley (John Wiley & Sons)
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English
β 256 KB
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## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that