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A PL study of CIGS thin films implanted with He and D ions

✍ Scribed by M.V. Yakushev; R.W. Martin; J. Krustok; H.W. Schock; R.D. Pilkington; A.E. Hill; R.D. Tomlinson

Book ID
114086903
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
308 KB
Volume
361-362
Category
Article
ISSN
0040-6090

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Implantation of single crystalline iron
Implantation of single crystalline iron garnet thin films with He+, B+, and Si+ ions
✍ Ostafiychuk, B. K. ;Fedoriv, V. D. ;Yaremiy, I. P. ;Garpul, O. Z. ;Kurovets, V. πŸ“‚ Article πŸ“… 2011 πŸ› John Wiley and Sons 🌐 English βš– 415 KB

## Abstract The mechanisms of defect formation in single crystalline epitaxial iron garnet thin films implanted with intermediate energy He^+^, B^+^, and Si^+^ ions have been investigated. X‐ray diffraction and modeling of the implantation process are used to show the effectiveness of defect format