✦ LIBER ✦
Quantitative analyses of photovoltaic CIGS thin films via SIMS depth profiling with elemental ions and MCs + clusters
✍ Scribed by Lee, Jihye; Kim, Seon Hee; Lee, Yeonhee
- Book ID
- 121785877
- Publisher
- John Wiley and Sons
- Year
- 2014
- Tongue
- English
- Weight
- 673 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0142-2421
- DOI
- 10.1002/sia.5432
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