A parametric study of pulsed laser deposited niobium diselenide thin-film growth
β Scribed by Allan E. Day; J.S. Zabinski
- Book ID
- 107864432
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 589 KB
- Volume
- 238
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Elemental depth profile examined using secondary-ion mass spectroscopy and structural profile examined using grazing-incident X-ray difiactometry were applied to analyze the growth behavior of Pb, -, La,(Zr,Ti, ~ ,)03 (PLZTO) and Pb, -La,TiO, (PLTO) thin films deposited on a Si substrate. When depos
a b s t r a c t Indium oxide films are deposited by pulsed laser deposition in the presence of oxygen atmosphere, on different substrates, namely GaAs, Si, quartz, and glass. The structural, morphological, and interface characteristics are studied. Cubic In 2 O 3 phase is confirmed by high resolutio