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A note on the contrast mechanism of electron channeling patterns in scanning electron microscopy

โœ Scribed by Yamamoto, T.

Publisher
John Wiley and Sons
Year
1977
Tongue
English
Weight
171 KB
Volume
43
Category
Article
ISSN
0031-8965

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## Abstract The imaging and characterization of dislocations is commonly carried out by thin foil transmission electron microscopy (TEM) using diffraction contrast imaging. However, the thin foil approach is limited by difficult sample preparation, thin foil artifacts, relatively small viewable are