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A new X-ray method for measuring residual stress and diffraction line broadness and its automation

โœ Scribed by M. Kurita

Publisher
Elsevier Science
Year
1987
Weight
659 KB
Volume
20
Category
Article
ISSN
0308-9126

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## Abstract As machining induced residual stress states are an important factor for the distortion of parts during following heat treatments, a complete characterization of the components residual stress state is required. For a gain of time, magnetic and micromagnetic analysis has been compared wi