A new X-ray method for measuring residual stress and diffraction line broadness and its automation : Kurita, M. NDT international, vol. 20, no. 5, pp. 277–284 (Oct. 1987)

• Publisher: Elsevier Science
• Year: 1989
• Weight: 173 KB
• Volume: 22
• Category: Article
• ISSN: 0308-9126
• DOI: 10.1016/0308-9126(89)91218-2