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A convenient method to determine the bulk modulus of nanowires and its temperature dependence based on X-ray diffraction measurement

โœ Scribed by Xin Feng Li; Guang Tao Fei; Wen Fei Zhou; Li De Zhang


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
340 KB
Volume
150
Category
Article
ISSN
0038-1098

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