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A new technique for monitoring the microscopic electronic surface structures of sputtered thin films

✍ Scribed by K. Obara; P. Yiji; Y. Suemoto; T. Ogushi; W. Möller

Book ID
108390460
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
591 KB
Volume
51
Category
Article
ISSN
0042-207X

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