๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A new physics-based model for time-dependent Dielectric breakdown

โœ Scribed by B.J. Schlund; J. Suehle; C. Messick; P. Chaparala


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
265 KB
Volume
36
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


A unified time dependent model for low c
โœ Xianjie Yang ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 284 KB

In this paper, a unified time dependent model for low cycle fatigue and ratchetting failure has been developed based on the microcrack growth. The model utilized fracture mechanics theory using J-integral under creep-fatigue loading and assumed that the microcrack propagation determines the failure