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A quantitative physical model for time-dependent breakdown in SiO2: I. C. Chen, S. Holland and C. Hu. 23 a. Proc. Reliab. Phys. Symp. 24 (1985)


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
123 KB
Volume
26
Category
Article
ISSN
0026-2714

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