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A New Model for Light-induced Degradation by B-O Defects in p- and n-type Silicon

✍ Scribed by Fraser, Keith; Blanc-Pelissier, Daniele; Dubois, Sebastien; Veirman, Jordi; Tanay, Florent; Lemiti, Mustapha

Book ID: 122787021
Publisher: Elsevier
Year: 2013
Weight: 316 KB
Volume: 38
Category: Article
ISSN: 1876-6102
DOI: 10.1016/j.egypro.2013.07.315

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