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A New Method of Determination of Parameters of Traps in Semiconductors

✍ Scribed by V.M. Aroutiounian; V.V. Bouniatian; S.Sh. Gevorgian; P. Soukiassian

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 135 KB
Volume: 210
Category: Article
ISSN: 0370-1972
DOI: 10.1002/(sici)1521-3951(199812)210:2<805::aid-pssb805>3.0.co;2-p

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