A new approach for the measurement of a.c. arc parameters using microprocessors
β Scribed by M.A.H. Kadhim; S.B. Sadiq-Hussain; K. Danial
- Publisher
- Elsevier Science
- Year
- 1986
- Weight
- 562 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0745-7138
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π SIMILAR VOLUMES
Figure 4 Characteristic impedance and dispersion characteristics for the dominant and first two higher-order modes of shielded dielectric-loaded edge-coupled CBCPW structure with a = 4 mm, h , = h , = 1 mm, E , ~ = 2.22, and other parameters as in Figure 3 choosing appropriate loading and structura
The sensitivity properties of a linear system affected by parameter variations can be studied by means Of properly defined linear subspaces of the state space. Summary--In this paper a new approach to the study of parameter insensitivity of a linear, time-varying, continuous and finite-dimensional