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A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits

✍ Scribed by Mirzaei, Mohammad; Tabandeh, Mahmoud; Alizadeh, Bijan; Navabi, Zainalabedin


Book ID
125501423
Publisher
Institute of Electrical and Electronics Engineers
Year
2013
Tongue
English
Weight
453 KB
Volume
30
Category
Article
ISSN
2168-2356

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