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Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams

✍ Scribed by Ghosh, I.; Fujita, M.

Book ID: 119778755
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 237 KB
Volume: 20
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.913758

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