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A modeling technique for characterizing ion-implanted material using C–V and DLTS data

✍ Scribed by J.M. Golio; R.J. Trew; G.N. Maracas; H. Lefevre

Publisher: Elsevier Science
Year: 1984
Tongue: English
Weight: 679 KB
Volume: 27
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(84)90170-9

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