A modeling technique for characterizing ion-implanted material using C-V and DLTS data : J. M. Golio, R. J. Trew, G. N. Maracas and H. Lefevre. Solid St. Electron. 27 (4), 367 (1984)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 21 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)91032-1