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A model for the temperature-dependent saturated ID -VD characteristics of an a-Si:H thin-film transistor

โœ Scribed by Lee, W.-S.; Neudeck, G.W.; Choi, J.; Luan, S.


Book ID
114538126
Publisher
IEEE
Year
1991
Tongue
English
Weight
535 KB
Volume
38
Category
Article
ISSN
0018-9383

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