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Temperature-dependent ID-VD characteristics and analytical model for a-Si:H thin film transistors

✍ Scribed by Woo-Sun Lee; Gerold W. Neudeck; Min-Koo Han

Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 229 KB
Volume: 37
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(94)90184-8

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