A theoretical analysis of temperature dependence on hydrogenated amorphous silicon thin-film transistors with the consideration of resistance of the a-Si:H film layer as a function of temperature

✍ Scribed by Bor-Yir Chen; Jiann-Ruey Chen; Fenq-Lin Jenq; Chum-Sam Hong

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 450 KB
• Volume: 100-101
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(96)00347-9