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A model for capacitance reconstruction from measured lossy MOS capacitance voltage characteristics

✍ Scribed by Kwa, K S K; Chattopadhyay, S; Jankovic, N D; Olsen, S H; Driscoll, L S; O Neill, A G


Book ID
120494286
Publisher
Institute of Physics
Year
2002
Tongue
English
Weight
215 KB
Volume
18
Category
Article
ISSN
0268-1242

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