✦ LIBER ✦
The accuracy of reconstructing the semiconductor doping profile from capacitance-voltage characteristics measured during electrochemical etching
✍ Scribed by I. R. Karetnikova; I. M. Nefedov; V. I. Shashkin
- Book ID
- 110127409
- Publisher
- Springer
- Year
- 2001
- Tongue
- English
- Weight
- 83 KB
- Volume
- 35
- Category
- Article
- ISSN
- 1063-7826
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