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A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs

✍ Scribed by Raul Rengel; Martin, M.J.; Gonzalez, T.; Mateos, J.; Pardo, D.; Dambrine, G.; Raskin, J.-P.; Danneville, F.

Book ID: 114618121
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 757 KB
Volume: 53
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2005.863541

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