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[IEEE Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, 2004. - Punta Cana, Dominican Republic (November 3-5,2004)] Proceedings of the Fifth IEEE International Caracas Conference on Devices, Circuits and Systems, 2004. - RF and noise properties of SOI MOSFETs, including the influence of a direct tunneling gate current (invited)

✍ Scribed by Danneville, F.; Iniguez, B.; Pailloncy, G.; Dambrine, G.

Book ID: 126696933
Publisher: IEEE
Year: 2004
Weight: 553 KB
Volume: 1
Category: Article
ISBN-13: 9780780387775
DOI: 10.1109/ICCDCS.2004.1393363

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