A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors

✍ Scribed by Prijić, A; Danković, D; Vračar, Lj; Manić, I; Prijić, Z; Stojadinović, N

• Book ID: 121202680
• Publisher: Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 602 KB
• Volume: 23
• Category: Article
• ISSN: 0957-0233
• DOI: 10.1088/0957-0233/23/8/085003